================================== XOP 2.0 =====================================
---What is XOP?---
XOP (X-ray Oriented Programs) is a graphical user interface (GUI) to
run computer programs that calculate basic information needed by
synchrotron radiation beamline scientists and engineers. It can also be
used as a front end for specific codes or packages for
data analysis and data reduction.
XOP contains a customized database for optical and atomic constants.
It has a flexible design and new applications may be added.
The XOP interface is written in the Interactive Data Language (IDL) from
Research Systems Inc., and it runs on the Unix (HP, Sun, Linux,
DEC-Alpha, and Silicon Graphics), and on the Windows 95/98/NT/2000
operating systems.
It has been built with an IDL license embedded and is available under some
limited conditions free of charge from the authors.
The XOP Web page is:
http://www.esrf.fr/computing/scientific/xop
---What is new in XOP 2.0 respect to XOP1.9---
i) Interface:
- All applications present a uniform look
- All applications' parameters can be saved in an ASCII file for later restoring. It is possible to save parameters as user default.
- Improved access to documentation
- Possibility of opening application files from the main XOP window.
- XOP Environment variables can be seen and edited from the main XOP window (also for debugging purposes)
- Printing facilities improved (see Xplot item) 2) New applications
- XTubes and XTube_W to compute x-ray tube generator spectra.
- CRL to compute compound refractive lenses
- Multiple beAM diffractiON (MAMON)
- XOP macros
3) Hardware Platforms
Platform Vendor Hardware Operating System (Version) Unix Compaq Alpha Digital Unix (4.0)
HP PA-RISC HP-UX (10.20) IBM Intel x86 Linux (2.0) SGI Mips Irix (6.2) SUN SPARC-Ultra 1/2 Solaris 2 (2.6) Windows Microsoft Intel x86 Windows 95, 98, NT 4.0, 2000 4) Xplot
Improved access to SPEC and DABAX files Direct printing to hardware printers TrueType fonts implemented Better selection of colors with an improved default color table New operations: Power Spectral Density. Peak search, peak fit... Improved Non-Linear fit. Multiple peak fitting. 5) Extensions available:
SHADOWVUI (x-ray tracing) XAID (XAFS toolbox) PROW (macromolecular diffraction integration) SAXS_DISPLAY (small angle x-ray scattering data analysis) IMD (multilayers) TOPO (analysis on profiles and surfaces) 6) Reference M. Sanchez del Rio and R.J. Dejus "XOP: Recent Developments" SPIE Vol. 2448 pp. 340-345 (1998)